279 articles – 2094 references  [version française]
Detailed view Conference proceedings
Proceedings-International-Test-Conference-1990-Cat.-No.90CH2910-6., Washington, DC : États-Unis (1990)
Efficient UBIST implementation for microprocessor sequencing parts
M. Nicolaidis1, 2

An improved self-checking solution for the sequencing part of the MC 68000 microprocessor is presented. Compared with previous self-checking schemes for this microprocessor, the present scheme makes its possible to reduce the overhead and simplifies the implementation of both functional circuits, and checkers. The unified BIST (built-in self-test) method is applied to this scheme. This method uses a merging of self-checking and BIST techniques and allows a high fault coverage for all tests needed for integrated circuits, e.g., offline test (design verification, manufacturing, and maintenance test) and online concurrent error detection. An area overhead of about 27% is required, which is quite satisfactory in comparison with previous results.
1:  IROC TECHNOLOGIES - iROc Technologies
2:  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
logic-testing – production-testing – mentation-for-microprocessor-sequencing – self-checking – MC-68000-microprocessor – functional-circuits – unified-BIST – fault-coverage – integrated-circuits – offline-test – design-verification – maintenance-test – online-concurrent-error-detection – area-overhead