284 articles – 2152 references  [version française]
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Data-Processing:-Opportunities-and-Drawbacks.-Proceedings-of-Convention-Informatique, Paris : France (1985)
Are VLSI circuits testable?
B. Courtois1

Testing integrated circuits is becoming more and more difficult due to their increasing complexity. How can VLSI circuits be tested? Classical methods consider either a logical representation or a functional abstraction. The limits of these methods have been revealed with VLSI and hence the question of the testability of these circuits exists. Built-in test, self-checking circuits and new tools allowing one to observe directly how a circuit is functioning, are some answers to the question.
1:  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
integrated-circuit-testing – built-in-test – VLSI-circuits – logical-representation – functional-abstraction – testability- – self-checking-circuits