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TIMA Laboratory | Publications |  |
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TIMA Laboratory | Publications | |
| Detailed view | Conference proceedings |
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| Data-Processing:-Opportunities-and-Drawbacks.-Proceedings-of-Convention-Informatique, Paris : France (1985) |
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| Are VLSI circuits testable? |
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| B. Courtois1 |
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| Testing integrated circuits is becoming more and more difficult due to their increasing complexity. How can VLSI circuits be tested? Classical methods consider either a logical representation or a functional abstraction. The limits of these methods have been revealed with VLSI and hence the question of the testability of these circuits exists. Built-in test, self-checking circuits and new tools allowing one to observe directly how a circuit is functioning, are some answers to the question. |
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| 1: | TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture |
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| integrated-circuit-testing – built-in-test – VLSI-circuits – logical-representation – functional-abstraction – testability- – self-checking-circuits |
| hal-00013451, version 1 | |
| http://hal.archives-ouvertes.fr/hal-00013451 | |
| oai:hal.archives-ouvertes.fr:hal-00013451 | |
| From: Lucie Torella | |
| Submitted on: Tuesday, 8 November 2005 14:51:31 | |
| Updated on: Thursday, 23 February 2006 17:18:06 | |