282 articles – 2121 references  [version française]
Detailed view Conference proceedings
(2003)
Single event upsets on a read only memory based complex programmable logic device
F. Faure1, R. Velazco2

SEU susceptibility of a ROM-based CPLD has been measured. Four different cross-sections for the same flip-flops are reported, putting in evidence the need for carefully planning the test pattern used during evaluation.
1:  IST. DI ASTROFISICA SPAZIALE E FISICA COSMICA - CNR
2:  TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture
single-event-upsets – read-only-memory-based-complex-programmable-logic-device – SEU-susceptibility – ROM-based-CPLD – flip-flop-cross-sections – test-pattern