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Conference proceedings

(2003)

Single event upsets on a read only memory based complex programmable logic device

F. Faure1, R. Velazco2

SEU susceptibility of a ROM-based CPLD has been measured. Four different cross-sections for the same flip-flops are reported, putting in evidence the need for carefully planning the test pattern used during evaluation.

1:	IST. DI ASTROFISICA SPAZIALE E FISICA COSMICA - CNR
2:	TIMA - Techniques of Informatics and Microelectronics for integrated systems Architecture

Keyword(s) : single-event-upsets – read-only-memory-based-complex-programmable-logic-device – SEU-susceptibility – ROM-based-CPLD – flip-flop-cross-sections – test-pattern

hal-00008186, version 1

http://hal.archives-ouvertes.fr/hal-00008186

oai:hal.archives-ouvertes.fr:hal-00008186

From: Lucie Torella <>

Submitted on: Wednesday, 24 August 2005 15:01:55

Updated on: Wednesday, 24 August 2005 15:01:55