155 articles – 191 references  [version française]
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fulltext access INHIBITION OF LIGHT EMISSION IN A 2.5D PHOTONIC STRUCTURE
Peretti R. et al
Journal of Applied Physics 116 (2014) 023107 [hal-01022743 - version 1]
fulltext access Quantitative robust linear parameter varying H∞ vibration control of flexible structures for saving the control energy
Zhang K. et al
Journal of Intelligent Material Systems and Structures (2014) 1-22 [hal-01009959 - version 1]
fulltext access Coupling of quantum dots with a photon cage
Artinyan R. et al
In CLEO 2014 - CLEO2014, United States (2014) [hal-01016811 - version 1]
fulltext access Optical characterization of active photon cages
Artinyan R. et al
Dans Proc. SPIE 9127, Photonic Crystal Materials and Devices XI - SPIE Photonics Europe 2014, Belgique (2014) [hal-01016742 - version 1]
fulltext access Blue light absorption enhancement based on vertically channelling modes in nano-holes arrays
Gomard G. et al
Applied Physics Letters 104, 5 (2014) 051119 [hal-00943141 - version 1]
fulltext access Absorption enhancement in photonic crystal thin films by pseudo disordered perturbations
Peretti R. et al
Dans fall meeting 2013 - MRS Fall Meeting 2013, États-Unis (2013) [hal-00944717 - version 1]
fulltext access Reassessment of the intrinsic carrier density temperature dependence in crystalline silicon
Couderc R. et al
Journal of Applied Physics 115 (2014) 093705 [hal-00956479 - version 1]
fulltext access Down Converter Device Combining Rare-Earth Doped Thin Layer and Photonic Crystal for c-Si Based Solar Cell
Deschamps T. et al
Dans proceeding of 28th European Photovoltaic Solar Energy Conference and Exhibition : Novel Materials and Concepts for Modules - 28th European Photovoltaic Solar Energy Conference and Exhibition, France (2013) [hal-00908631 - version 1]
fulltext access Absorption control in pseudodisordered photonic-crystal thin film
Peretti R. et al
Physical Review A 88, 5 (2013) 053835 [hal-00908405 - version 1]
Characterization of the thermal conductivity of insulating thin films by Scanning Thermal Microscopy
Gomès S. et al
Microelectronics Journal 44, 11 (2013) 1029-1034 [hal-01018078 - version 1]