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Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs Malbert N. et al Microelectronics Reliability (2009) xx [hal-00401267 - version 1]

InAs/InP quantum dots: from single to coupled dots applications Cornet C. et al Dans Physica Status Solidi (c) - International Conference on Quantum Dots, France (2006) [hal-00491717 - version 1]